Optimization of Electrospray-Scanning Mobility Particle Sizer (ES-SMPS) Residual Control and Comparative Evaluation of Low-Concentration Silica Nanoparticle Characterization
- DOI
- 10.1021/acs.langmuir.6c05107
- Published
- 2026-10-21
- Container
- Langmuir
- Publisher
- American Chemical Society (ACS)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acs.langmuir.6c05107,
title = {Optimization
of Electrospray-Scanning Mobility Particle
Sizer (ES-SMPS) Residual Control and Comparative Evaluation of Low-Concentration
Silica Nanoparticle Characterization},
author = {M. A. Rahman and Zhengyuan Pan and Qisheng Ou and David Y. H. Pui},
year = {2026},
journal = {Langmuir},
doi = {10.1021/acs.langmuir.6c05107},
url = {https://doi.org/10.1021/acs.langmuir.6c05107}
}RIS
TY - JOUR TI - Optimization of Electrospray-Scanning Mobility Particle Sizer (ES-SMPS) Residual Control and Comparative Evaluation of Low-Concentration Silica Nanoparticle Characterization AU - M. A. Rahman AU - Zhengyuan Pan AU - Qisheng Ou AU - David Y. H. Pui PY - 2026 JO - Langmuir DO - 10.1021/acs.langmuir.6c05107 UR - https://doi.org/10.1021/acs.langmuir.6c05107 ER -
APA
Rahman, M. A., Pan, Z., Ou, Q., & Pui, D. Y. H. (2026). Optimization of Electrospray-Scanning Mobility Particle Sizer (ES-SMPS) Residual Control and Comparative Evaluation of Low-Concentration Silica Nanoparticle Characterization. Langmuir. https://doi.org/10.1021/acs.langmuir.6c05107
Source records
- crossref · retrieved 2026-11-04T08:12:30.645Z