Engineering Contact Line Dynamics: Predicting Pinning beyond the Point-Defect Approximation

Xin Huang, HengAn Wu, FengChao Wang

Open source

DOI: 10.1021/acs.langmuir.6c05325
Published: 2026-10-07
Container: Langmuir
Publisher: American Chemical Society (ACS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1021/acs.langmuir.6c05325,
  title = {Engineering Contact Line Dynamics: Predicting Pinning
beyond the Point-Defect Approximation},
  author = {Xin Huang and HengAn Wu and FengChao Wang},
  year = {2026},
  journal = {Langmuir},
  doi = {10.1021/acs.langmuir.6c05325},
  url = {https://doi.org/10.1021/acs.langmuir.6c05325}
}

RIS

TY  - JOUR
TI  - Engineering Contact Line Dynamics: Predicting Pinning
beyond the Point-Defect Approximation
AU  - Xin Huang
AU  - HengAn Wu
AU  - FengChao Wang
PY  - 2026
JO  - Langmuir
DO  - 10.1021/acs.langmuir.6c05325
UR  - https://doi.org/10.1021/acs.langmuir.6c05325
ER  -

APA

Huang, X., Wu, H., & Wang, F. (2026). Engineering Contact Line Dynamics: Predicting Pinning beyond the Point-Defect Approximation. Langmuir. https://doi.org/10.1021/acs.langmuir.6c05325

Source records

crossref · retrieved 2026-11-03T21:11:26.187Z