Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization.
- DOI
- 10.1021/acs.nanolett.6c00362
- Published
- 2026 Jun 24
- Container
- Nano letters
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acs.nanolett.6c00362,
title = {Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization.},
author = {Kim D and Choi J and Seo HK and Lee SJ and Kwak B and Kim HM and Park MH and Kang Y and Yang MK and Kwon D},
year = {2026},
journal = {Nano letters},
doi = {10.1021/acs.nanolett.6c00362},
url = {https://doi.org/10.1021/acs.nanolett.6c00362}
}RIS
TY - JOUR TI - Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization. AU - Kim D AU - Choi J AU - Seo HK AU - Lee SJ AU - Kwak B AU - Kim HM AU - Park MH AU - Kang Y AU - Yang MK AU - Kwon D PY - 2026 JO - Nano letters DO - 10.1021/acs.nanolett.6c00362 UR - https://doi.org/10.1021/acs.nanolett.6c00362 ER -
APA
D, K., J, C., HK, S., SJ, L., B, K., HM, K., MH, P., Y, K., MK, Y., & D, K. (2026). Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization.. Nano letters. https://doi.org/10.1021/acs.nanolett.6c00362
Source records
- pubmed · retrieved 2026-09-26T09:46:12.376Z