Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization.

Kim D, Choi J, Seo HK, Lee SJ, Kwak B, Kim HM, Park MH, Kang Y, Yang MK, Kwon D

Open source

DOI
10.1021/acs.nanolett.6c00362
Published
2026 Jun 24
Container
Nano letters
Publisher
Not recorded
Open access
unknown

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BibTeX

@article{allodium:10.1021/acs.nanolett.6c00362,
  title = {Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization.},
  author = {Kim D and Choi J and Seo HK and Lee SJ and Kwak B and Kim HM and Park MH and Kang Y and Yang MK and Kwon D},
  year = {2026},
  journal = {Nano letters},
  doi = {10.1021/acs.nanolett.6c00362},
  url = {https://doi.org/10.1021/acs.nanolett.6c00362}
}

RIS

TY  - JOUR
TI  - Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization.
AU  - Kim D
AU  - Choi J
AU  - Seo HK
AU  - Lee SJ
AU  - Kwak B
AU  - Kim HM
AU  - Park MH
AU  - Kang Y
AU  - Yang MK
AU  - Kwon D
PY  - 2026
JO  - Nano letters
DO  - 10.1021/acs.nanolett.6c00362
UR  - https://doi.org/10.1021/acs.nanolett.6c00362
ER  - 

APA

D, K., J, C., HK, S., SJ, L., B, K., HM, K., MH, P., Y, K., MK, Y., & D, K. (2026). Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise Characterization.. Nano letters. https://doi.org/10.1021/acs.nanolett.6c00362

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