Defect-Engineered Scaling of Lead-Free Ferroelectrics with Ultra-Low-Voltage Switching.
- DOI
- 10.1021/acs.nanolett.6c01514
- Published
- 2026 Jul 29
- Container
- Nano letters
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acs.nanolett.6c01514,
title = {Defect-Engineered Scaling of Lead-Free Ferroelectrics with Ultra-Low-Voltage Switching.},
author = {Ghanbari R and Wang J and Kp H and Shi Z and Khandelwal A and Koons K and Rodrigues E and Zhou T and Holt M and Muller DA and Hwang HY and Xu R},
year = {2026},
journal = {Nano letters},
doi = {10.1021/acs.nanolett.6c01514},
url = {https://doi.org/10.1021/acs.nanolett.6c01514}
}RIS
TY - JOUR TI - Defect-Engineered Scaling of Lead-Free Ferroelectrics with Ultra-Low-Voltage Switching. AU - Ghanbari R AU - Wang J AU - Kp H AU - Shi Z AU - Khandelwal A AU - Koons K AU - Rodrigues E AU - Zhou T AU - Holt M AU - Muller DA AU - Hwang HY AU - Xu R PY - 2026 JO - Nano letters DO - 10.1021/acs.nanolett.6c01514 UR - https://doi.org/10.1021/acs.nanolett.6c01514 ER -
APA
R, G., J, W., H, K., Z, S., A, K., K, K., E, R., T, Z., M, H., DA, M., HY, H., & R, X. (2026). Defect-Engineered Scaling of Lead-Free Ferroelectrics with Ultra-Low-Voltage Switching.. Nano letters. https://doi.org/10.1021/acs.nanolett.6c01514
Source records
- pubmed · retrieved 2026-09-27T12:27:08.471Z