On the Contact Optimization of ALD-Based MoS(2) FETs: Correlation of Processing Conditions and Interface Chemistry with Device Electrical Performance.

Mahlouji R, Zhang Y, Verheijen MA, Hofmann JP, Kessels WMM, Sagade AA, Bol AA

Open source

DOI
10.1021/acsaelm.1c00379
Published
2021 Jul 27
Container
ACS applied electronic materials
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1021/acsaelm.1c00379,
  title = {On the Contact Optimization of ALD-Based MoS(2) FETs: Correlation of Processing Conditions and Interface Chemistry with Device Electrical Performance.},
  author = {Mahlouji R and Zhang Y and Verheijen MA and Hofmann JP and Kessels WMM and Sagade AA and Bol AA},
  year = {2021},
  journal = {ACS applied electronic materials},
  doi = {10.1021/acsaelm.1c00379},
  url = {https://doi.org/10.1021/acsaelm.1c00379}
}

RIS

TY  - JOUR
TI  - On the Contact Optimization of ALD-Based MoS(2) FETs: Correlation of Processing Conditions and Interface Chemistry with Device Electrical Performance.
AU  - Mahlouji R
AU  - Zhang Y
AU  - Verheijen MA
AU  - Hofmann JP
AU  - Kessels WMM
AU  - Sagade AA
AU  - Bol AA
PY  - 2021
JO  - ACS applied electronic materials
DO  - 10.1021/acsaelm.1c00379
UR  - https://doi.org/10.1021/acsaelm.1c00379
ER  - 

APA

R, M., Y, Z., MA, V., JP, H., WMM, K., AA, S., & AA, B. (2021). On the Contact Optimization of ALD-Based MoS(2) FETs: Correlation of Processing Conditions and Interface Chemistry with Device Electrical Performance.. ACS applied electronic materials. https://doi.org/10.1021/acsaelm.1c00379

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