In Situ Scanning Electron Microscopy Investigation of Failure Mechanisms in Multilayer Coatings

Won-Bin Kang, Yuzhen Liu, Youn-Hoo Hwang, Ji-min Lee, Dae-Eun Kim

Open source

DOI: 10.1021/acsami.5c16006
Published: 2025-11-07
Container: ACS Applied Materials & Interfaces
Publisher: American Chemical Society (ACS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1021/acsami.5c16006,
  title = {In Situ Scanning Electron Microscopy Investigation of Failure Mechanisms in Multilayer Coatings},
  author = {Won-Bin Kang and Yuzhen Liu and Youn-Hoo Hwang and Ji-min Lee and Dae-Eun Kim},
  year = {2025},
  journal = {ACS Applied Materials \&amp; Interfaces},
  doi = {10.1021/acsami.5c16006},
  url = {https://doi.org/10.1021/acsami.5c16006}
}

RIS

TY  - JOUR
TI  - In Situ Scanning Electron Microscopy Investigation of Failure Mechanisms in Multilayer Coatings
AU  - Won-Bin Kang
AU  - Yuzhen Liu
AU  - Youn-Hoo Hwang
AU  - Ji-min Lee
AU  - Dae-Eun Kim
PY  - 2025
JO  - ACS Applied Materials &amp; Interfaces
DO  - 10.1021/acsami.5c16006
UR  - https://doi.org/10.1021/acsami.5c16006
ER  -

APA

Kang, W., Liu, Y., Hwang, Y., Lee, J., & Kim, D. (2025). In Situ Scanning Electron Microscopy Investigation of Failure Mechanisms in Multilayer Coatings. ACS Applied Materials & Interfaces. https://doi.org/10.1021/acsami.5c16006

Source records

crossref · retrieved 2026-09-25T08:09:01.709Z