SEI Characterization Using XPS: Resolving Rinsing Effects through Cryogenic Implementation.
- DOI
- 10.1021/acsami.6c03202
- Published
- 2026-06-24
- Container
- ACS Appl Mater Interfaces
- Publisher
- Not recorded
- Open access
- no
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Cite this work
BibTeX
@article{allodium:10.1021/acsami.6c03202,
title = {SEI Characterization Using XPS: Resolving Rinsing Effects through Cryogenic Implementation.},
author = {Shuchi SB and D'Acunto G and Gutierrez KMS and Sayavong P and Oyakhire ST and Jamtgaard J and Cui Y and Bent SF.},
year = {2026},
journal = {ACS Appl Mater Interfaces},
doi = {10.1021/acsami.6c03202},
url = {https://doi.org/10.1021/acsami.6c03202}
}RIS
TY - JOUR TI - SEI Characterization Using XPS: Resolving Rinsing Effects through Cryogenic Implementation. AU - Shuchi SB AU - D'Acunto G AU - Gutierrez KMS AU - Sayavong P AU - Oyakhire ST AU - Jamtgaard J AU - Cui Y AU - Bent SF. PY - 2026 JO - ACS Appl Mater Interfaces DO - 10.1021/acsami.6c03202 UR - https://doi.org/10.1021/acsami.6c03202 ER -
APA
SB, S., G, D., KMS, G., P, S., ST, O., J, J., Y, C., & SF., B. (2026). SEI Characterization Using XPS: Resolving Rinsing Effects through Cryogenic Implementation.. ACS Appl Mater Interfaces. https://doi.org/10.1021/acsami.6c03202
Source records
- europe-pmc · retrieved 2026-09-26T18:17:26.245Z