Coercive Field Reduction in Ultra-Thin Al1-xScxN via Interfacial Engineering with a Scandium Bottom Electrode.
- DOI
- 10.1021/acsami.6c08411
- Published
- 2026 Sep 16
- Container
- ACS applied materials & interfaces
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acsami.6c08411,
title = {Coercive Field Reduction in Ultra-Thin Al1-xScxN via Interfacial Engineering with a Scandium Bottom Electrode.},
author = {Zhang Y and Rai RK and Esteves G and Wang Y and Jariwala DM and Stach EA and Olsson RH 3rd},
year = {2026},
journal = {ACS applied materials \& interfaces},
doi = {10.1021/acsami.6c08411},
url = {https://doi.org/10.1021/acsami.6c08411}
}RIS
TY - JOUR TI - Coercive Field Reduction in Ultra-Thin Al1-xScxN via Interfacial Engineering with a Scandium Bottom Electrode. AU - Zhang Y AU - Rai RK AU - Esteves G AU - Wang Y AU - Jariwala DM AU - Stach EA AU - Olsson RH 3rd PY - 2026 JO - ACS applied materials & interfaces DO - 10.1021/acsami.6c08411 UR - https://doi.org/10.1021/acsami.6c08411 ER -
APA
Y, Z., RK, R., G, E., Y, W., DM, J., EA, S., & 3rd, O. R. (2026). Coercive Field Reduction in Ultra-Thin Al1-xScxN via Interfacial Engineering with a Scandium Bottom Electrode.. ACS applied materials & interfaces. https://doi.org/10.1021/acsami.6c08411
Source records
- pubmed · retrieved 2026-09-25T12:10:42.039Z