In Situ Composition and Thickness Monitoring during (Bi(x)In(1‑x))(2)Se(3) Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices.
- DOI
- 10.1021/acsanm.6c00073
- Published
- 2026 Apr 17
- Container
- ACS applied nano materials
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1021/acsanm.6c00073,
title = {In Situ Composition and Thickness Monitoring during (Bi(x)In(1‑x))(2)Se(3) Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices.},
author = {Hilse M and Niedel J and Zhang Q and Richardella A and Hijazi H and Shallenberger JR and Hengstebeck R and Law S and Samarth N and Peiris FC},
year = {2026},
journal = {ACS applied nano materials},
doi = {10.1021/acsanm.6c00073},
url = {https://doi.org/10.1021/acsanm.6c00073}
}RIS
TY - JOUR TI - In Situ Composition and Thickness Monitoring during (Bi(x)In(1‑x))(2)Se(3) Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices. AU - Hilse M AU - Niedel J AU - Zhang Q AU - Richardella A AU - Hijazi H AU - Shallenberger JR AU - Hengstebeck R AU - Law S AU - Samarth N AU - Peiris FC PY - 2026 JO - ACS applied nano materials DO - 10.1021/acsanm.6c00073 UR - https://doi.org/10.1021/acsanm.6c00073 ER -
APA
M, H., J, N., Q, Z., A, R., H, H., JR, S., R, H., S, L., N, S., & FC, P. (2026). In Situ Composition and Thickness Monitoring during (Bi(x)In(1‑x))(2)Se(3) Thin Film Growth: toward Automated Synthesis Control Using Spectroscopic Ellipsometry for Quantum and Spintronic Devices.. ACS applied nano materials. https://doi.org/10.1021/acsanm.6c00073
Source records
- pubmed · retrieved 2026-09-27T14:17:55.875Z