The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening
- DOI
- 10.1021/acsnano.1c04825
- Published
- 2021-08-11
- Container
- ACS Nano
- Publisher
- American Chemical Society (ACS)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acsnano.1c04825,
title = {The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening},
author = {Soohyung Park and Thorsten Schultz and Dongguen Shin and Niklas Mutz and Areej Aljarb and Hee Seong Kang and Chul-Ho Lee and Lain-Jong Li and Xiaomin Xu and Vincent Tung and Emil J. W. List-Kratochvil and Sylke Blumstengel and Patrick Amsalem and Norbert Koch},
year = {2021},
journal = {ACS Nano},
doi = {10.1021/acsnano.1c04825},
url = {https://doi.org/10.1021/acsnano.1c04825}
}RIS
TY - JOUR TI - The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening AU - Soohyung Park AU - Thorsten Schultz AU - Dongguen Shin AU - Niklas Mutz AU - Areej Aljarb AU - Hee Seong Kang AU - Chul-Ho Lee AU - Lain-Jong Li AU - Xiaomin Xu AU - Vincent Tung AU - Emil J. W. List-Kratochvil AU - Sylke Blumstengel AU - Patrick Amsalem AU - Norbert Koch PY - 2021 JO - ACS Nano DO - 10.1021/acsnano.1c04825 UR - https://doi.org/10.1021/acsnano.1c04825 ER -
APA
Park, S., Schultz, T., Shin, D., Mutz, N., Aljarb, A., Kang, H. S., Lee, C., Li, L., Xu, X., Tung, V., List-Kratochvil, E. J. W., Blumstengel, S., Amsalem, P., & Koch, N. (2021). The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening. ACS Nano. https://doi.org/10.1021/acsnano.1c04825
Source records
- crossref · retrieved 2026-09-27T02:34:41.439Z