Electronic Control of Silicon Surface Atomic Structures with Two-Probe Scanning Tunneling Microscopy.

Onoda J, Livadaru L, Wolkow RA, Pitters J

DOI: 10.1021/acsnano.4c18016
Published: 2025 Aug 19
Container: ACS nano
Publisher: Not recorded
Open access: unknown

Credibility signals

limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

cautionDOI registered: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
cautionDOI resolves: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1021/acsnano.4c18016,
  title = {Electronic Control of Silicon Surface Atomic Structures with Two-Probe Scanning Tunneling Microscopy.},
  author = {Onoda J and Livadaru L and Wolkow RA and Pitters J},
  year = {2025},
  journal = {ACS nano},
  doi = {10.1021/acsnano.4c18016},
  url = {https://doi.org/10.1021/acsnano.4c18016}
}

RIS

TY  - JOUR
TI  - Electronic Control of Silicon Surface Atomic Structures with Two-Probe Scanning Tunneling Microscopy.
AU  - Onoda J
AU  - Livadaru L
AU  - Wolkow RA
AU  - Pitters J
PY  - 2025
JO  - ACS nano
DO  - 10.1021/acsnano.4c18016
UR  - https://doi.org/10.1021/acsnano.4c18016
ER  -

APA

J, O., L, L., RA, W., & J, P. (2025). Electronic Control of Silicon Surface Atomic Structures with Two-Probe Scanning Tunneling Microscopy.. ACS nano. https://doi.org/10.1021/acsnano.4c18016

Source records

pubmed · retrieved 2026-09-26T03:29:09.311Z