Characterization of WSe(2) Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses.
- DOI
- 10.1021/acsnano.5c10753
- Published
- 2025 Nov 11
- Container
- ACS nano
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acsnano.5c10753,
title = {Characterization of WSe(2) Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses.},
author = {Zhang T and Holzer J and Vystavěl T and Kolíbal M and Paiva de Araujo E and Stephens C and Britton TB},
year = {2025},
journal = {ACS nano},
doi = {10.1021/acsnano.5c10753},
url = {https://doi.org/10.1021/acsnano.5c10753}
}RIS
TY - JOUR TI - Characterization of WSe(2) Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses. AU - Zhang T AU - Holzer J AU - Vystavěl T AU - Kolíbal M AU - Paiva de Araujo E AU - Stephens C AU - Britton TB PY - 2025 JO - ACS nano DO - 10.1021/acsnano.5c10753 UR - https://doi.org/10.1021/acsnano.5c10753 ER -
APA
T, Z., J, H., T, V., M, K., E, P. D. A., C, S., & TB, B. (2025). Characterization of WSe(2) Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses.. ACS nano. https://doi.org/10.1021/acsnano.5c10753
Source records
- pubmed · retrieved 2026-09-25T22:52:10.039Z