Measurement Error Models Enable Accurate Correlation of Nanoscale Properties and Structures

Adam L. Pintar, Andrew C. Madison, Craig R. Copeland, Natalia Farkas, Samuel M. Stavis

Open source

DOI: 10.1021/acsnano.5c12141
Published: 2026-08-06
Container: ACS Nano
Publisher: American Chemical Society (ACS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1021/acsnano.5c12141,
  title = {Measurement
Error Models Enable Accurate Correlation
of Nanoscale Properties and Structures},
  author = {Adam L. Pintar and Andrew C. Madison and Craig R. Copeland and Natalia Farkas and Samuel M. Stavis},
  year = {2026},
  journal = {ACS Nano},
  doi = {10.1021/acsnano.5c12141},
  url = {https://doi.org/10.1021/acsnano.5c12141}
}

RIS

TY  - JOUR
TI  - Measurement
Error Models Enable Accurate Correlation
of Nanoscale Properties and Structures
AU  - Adam L. Pintar
AU  - Andrew C. Madison
AU  - Craig R. Copeland
AU  - Natalia Farkas
AU  - Samuel M. Stavis
PY  - 2026
JO  - ACS Nano
DO  - 10.1021/acsnano.5c12141
UR  - https://doi.org/10.1021/acsnano.5c12141
ER  -

APA

Pintar, A. L., Madison, A. C., Copeland, C. R., Farkas, N., & Stavis, S. M. (2026). Measurement Error Models Enable Accurate Correlation of Nanoscale Properties and Structures. ACS Nano. https://doi.org/10.1021/acsnano.5c12141

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crossref · retrieved 2026-09-25T22:50:47.313Z