Reliability and Stability Issues in Bi2O2Se/β-Bi2SeO5 Field-Effect Transistors

Mina Bahrami, Mohammad Rasool Davoudi, Axel Verdianu, Pedram Khakbaz, Dominic Waldhoer, Christoph Wilhelmer, Junchuan Tang, Congwei Tan, Aftab Nazir, Yu Zheng, Changze Liu, Hailin Peng, Theresia Knobloch, Michael Waltl, Tibor Grasser

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DOI: 10.1021/acsnano.6c00419
Published: 2026-07-14
Container: ACS Nano
Publisher: American Chemical Society (ACS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1021/acsnano.6c00419,
  title = {Reliability and
Stability Issues in Bi2O2Se/β-Bi2SeO5 Field-Effect
Transistors},
  author = {Mina Bahrami and Mohammad Rasool Davoudi and Axel Verdianu and Pedram Khakbaz and Dominic Waldhoer and Christoph Wilhelmer and Junchuan Tang and Congwei Tan and Aftab Nazir and Yu Zheng and Changze Liu and Hailin Peng and Theresia Knobloch and Michael Waltl and Tibor Grasser},
  year = {2026},
  journal = {ACS Nano},
  doi = {10.1021/acsnano.6c00419},
  url = {https://doi.org/10.1021/acsnano.6c00419}
}

RIS

TY  - JOUR
TI  - Reliability and
Stability Issues in Bi2O2Se/β-Bi2SeO5 Field-Effect
Transistors
AU  - Mina Bahrami
AU  - Mohammad Rasool Davoudi
AU  - Axel Verdianu
AU  - Pedram Khakbaz
AU  - Dominic Waldhoer
AU  - Christoph Wilhelmer
AU  - Junchuan Tang
AU  - Congwei Tan
AU  - Aftab Nazir
AU  - Yu Zheng
AU  - Changze Liu
AU  - Hailin Peng
AU  - Theresia Knobloch
AU  - Michael Waltl
AU  - Tibor Grasser
PY  - 2026
JO  - ACS Nano
DO  - 10.1021/acsnano.6c00419
UR  - https://doi.org/10.1021/acsnano.6c00419
ER  -

APA

Bahrami, M., Davoudi, M. R., Verdianu, A., Khakbaz, P., Waldhoer, D., Wilhelmer, C., Tang, J., Tan, C., Nazir, A., Zheng, Y., Liu, C., Peng, H., Knobloch, T., Waltl, M., & Grasser, T. (2026). Reliability and Stability Issues in Bi2O2Se/β-Bi2SeO5 Field-Effect Transistors. ACS Nano. https://doi.org/10.1021/acsnano.6c00419

Source records

crossref · retrieved 2026-09-26T22:10:33.070Z