Overcoming the Critical Thickness Limit: Interfacial Control of Crystallization Pathways in Atomic-Scale Dielectric Thin Films.
- DOI
- 10.1021/acsnano.6c00649
- Published
- 2026 Jun 23
- Container
- ACS nano
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acsnano.6c00649,
title = {Overcoming the Critical Thickness Limit: Interfacial Control of Crystallization Pathways in Atomic-Scale Dielectric Thin Films.},
author = {Le Trinh N and Kim W and Lee M and Gu B and Thi SV and Liu J and Nolan M and Kim HM and Kim H and Kim J and Kang Y and Lee HB},
year = {2026},
journal = {ACS nano},
doi = {10.1021/acsnano.6c00649},
url = {https://doi.org/10.1021/acsnano.6c00649}
}RIS
TY - JOUR TI - Overcoming the Critical Thickness Limit: Interfacial Control of Crystallization Pathways in Atomic-Scale Dielectric Thin Films. AU - Le Trinh N AU - Kim W AU - Lee M AU - Gu B AU - Thi SV AU - Liu J AU - Nolan M AU - Kim HM AU - Kim H AU - Kim J AU - Kang Y AU - Lee HB PY - 2026 JO - ACS nano DO - 10.1021/acsnano.6c00649 UR - https://doi.org/10.1021/acsnano.6c00649 ER -
APA
N, L. T., W, K., M, L., B, G., SV, T., J, L., M, N., HM, K., H, K., J, K., Y, K., & HB, L. (2026). Overcoming the Critical Thickness Limit: Interfacial Control of Crystallization Pathways in Atomic-Scale Dielectric Thin Films.. ACS nano. https://doi.org/10.1021/acsnano.6c00649
Source records
- pubmed · retrieved 2026-09-27T16:48:20.890Z