Direct Thermal Resistance Measurement of a Single Defect in Graphite

Tianqi Bai, Tao Zhang, Songfeng Pei, Ruilin Mao, Fachen Liu, Jiade Li, Ruochen Shi, Jinlong Du, Lede Xian, Wencai Ren, Zhongfan Liu, Peng Gao

Open source

DOI: 10.1021/acsnano.6c02016
Published: 2026-05-29
Container: ACS Nano
Publisher: American Chemical Society (ACS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1021/acsnano.6c02016,
  title = {Direct Thermal Resistance Measurement of a Single Defect in Graphite},
  author = {Tianqi Bai and Tao Zhang and Songfeng Pei and Ruilin Mao and Fachen Liu and Jiade Li and Ruochen Shi and Jinlong Du and Lede Xian and Wencai Ren and Zhongfan Liu and Peng Gao},
  year = {2026},
  journal = {ACS Nano},
  doi = {10.1021/acsnano.6c02016},
  url = {https://doi.org/10.1021/acsnano.6c02016}
}

RIS

TY  - JOUR
TI  - Direct Thermal Resistance Measurement of a Single Defect in Graphite
AU  - Tianqi Bai
AU  - Tao Zhang
AU  - Songfeng Pei
AU  - Ruilin Mao
AU  - Fachen Liu
AU  - Jiade Li
AU  - Ruochen Shi
AU  - Jinlong Du
AU  - Lede Xian
AU  - Wencai Ren
AU  - Zhongfan Liu
AU  - Peng Gao
PY  - 2026
JO  - ACS Nano
DO  - 10.1021/acsnano.6c02016
UR  - https://doi.org/10.1021/acsnano.6c02016
ER  -

APA

Bai, T., Zhang, T., Pei, S., Mao, R., Liu, F., Li, J., Shi, R., Du, J., Xian, L., Ren, W., Liu, Z., & Gao, P. (2026). Direct Thermal Resistance Measurement of a Single Defect in Graphite. ACS Nano. https://doi.org/10.1021/acsnano.6c02016

Source records

crossref · retrieved 2026-09-26T12:19:09.679Z