Third-Eigenmode Atomic Force Microscopy for Resolving Solvation Structures and Structural Defects in Organic Semiconductor Films under Ambient Conditions.
- DOI
- 10.1021/acsnano.6c15458
- Published
- 2026 Nov 10
- Container
- ACS nano
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1021/acsnano.6c15458,
title = {Third-Eigenmode Atomic Force Microscopy for Resolving Solvation Structures and Structural Defects in Organic Semiconductor Films under Ambient Conditions.},
author = {Atsas G and Cazorla A and Devaux F and Ruzié C and Geerts YH and Barrena E and Martin-Jimenez D},
year = {2026},
journal = {ACS nano},
doi = {10.1021/acsnano.6c15458},
url = {https://doi.org/10.1021/acsnano.6c15458}
}RIS
TY - JOUR TI - Third-Eigenmode Atomic Force Microscopy for Resolving Solvation Structures and Structural Defects in Organic Semiconductor Films under Ambient Conditions. AU - Atsas G AU - Cazorla A AU - Devaux F AU - Ruzié C AU - Geerts YH AU - Barrena E AU - Martin-Jimenez D PY - 2026 JO - ACS nano DO - 10.1021/acsnano.6c15458 UR - https://doi.org/10.1021/acsnano.6c15458 ER -
APA
G, A., A, C., F, D., C, R., YH, G., E, B., & D, M. (2026). Third-Eigenmode Atomic Force Microscopy for Resolving Solvation Structures and Structural Defects in Organic Semiconductor Films under Ambient Conditions.. ACS nano. https://doi.org/10.1021/acsnano.6c15458
Source records
- pubmed · retrieved 2026-11-11T00:28:19.713Z