Low-kV EDX Surface Analysis Can Replicate Metal Oxidation Trends of XPS for Semiconductor Package Assembly.

Krier JM, Sathia M, Menu EP, Han S

DOI: 10.1021/acsomega.6c00986
Published: 2026 Aug 18
Container: ACS omega
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1021/acsomega.6c00986,
  title = {Low-kV EDX Surface Analysis Can Replicate Metal Oxidation Trends of XPS for Semiconductor Package Assembly.},
  author = {Krier JM and Sathia M and Menu EP and Han S},
  year = {2026},
  journal = {ACS omega},
  doi = {10.1021/acsomega.6c00986},
  url = {https://doi.org/10.1021/acsomega.6c00986}
}

RIS

TY  - JOUR
TI  - Low-kV EDX Surface Analysis Can Replicate Metal Oxidation Trends of XPS for Semiconductor Package Assembly.
AU  - Krier JM
AU  - Sathia M
AU  - Menu EP
AU  - Han S
PY  - 2026
JO  - ACS omega
DO  - 10.1021/acsomega.6c00986
UR  - https://doi.org/10.1021/acsomega.6c00986
ER  -

APA

JM, K., M, S., EP, M., & S, H. (2026). Low-kV EDX Surface Analysis Can Replicate Metal Oxidation Trends of XPS for Semiconductor Package Assembly.. ACS omega. https://doi.org/10.1021/acsomega.6c00986

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pubmed · retrieved 2026-09-26T22:42:10.755Z