Nondestructive Localization of Subvisual Defects in Laser-Induced Graphene via Machine-Learning-Assisted Electrical Resistance Tomography.

Minakawa K, Takanashi K, Kimura Y, Klamchuen A, Wongwiriyapan W, Ikuno T

DOI: 10.1021/acsomega.6c01789
Published: 2026 Jun 16
Container: ACS omega
Publisher: Not recorded
Open access: yes

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BibTeX

@article{allodium:10.1021/acsomega.6c01789,
  title = {Nondestructive Localization of Subvisual Defects in Laser-Induced Graphene via Machine-Learning-Assisted Electrical Resistance Tomography.},
  author = {Minakawa K and Takanashi K and Kimura Y and Klamchuen A and Wongwiriyapan W and Ikuno T},
  year = {2026},
  journal = {ACS omega},
  doi = {10.1021/acsomega.6c01789},
  url = {https://doi.org/10.1021/acsomega.6c01789}
}

RIS

TY  - JOUR
TI  - Nondestructive Localization of Subvisual Defects in Laser-Induced Graphene via Machine-Learning-Assisted Electrical Resistance Tomography.
AU  - Minakawa K
AU  - Takanashi K
AU  - Kimura Y
AU  - Klamchuen A
AU  - Wongwiriyapan W
AU  - Ikuno T
PY  - 2026
JO  - ACS omega
DO  - 10.1021/acsomega.6c01789
UR  - https://doi.org/10.1021/acsomega.6c01789
ER  -

APA

K, M., K, T., Y, K., A, K., W, W., & T, I. (2026). Nondestructive Localization of Subvisual Defects in Laser-Induced Graphene via Machine-Learning-Assisted Electrical Resistance Tomography.. ACS omega. https://doi.org/10.1021/acsomega.6c01789

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pubmed · retrieved 2026-09-26T06:28:15.912Z