A Scan-BIST Structure to Test Delay Faults in Sequential Circuits

P. Girard, C. Landrault, V. Moreda, S. Pravossoudovitch, A. Virazel

Open source

DOI: 10.1023/a:1008305507376
Published: 1999-02
Container: Journal of Electronic Testing
Publisher: Springer Science and Business Media LLC
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1023/a:1008305507376,
  title = {A Scan-BIST Structure to Test Delay Faults in Sequential Circuits},
  author = {P. Girard and C. Landrault and V. Moreda and S. Pravossoudovitch and A. Virazel},
  year = {1999},
  journal = {Journal of Electronic Testing},
  doi = {10.1023/a:1008305507376},
  url = {https://doi.org/10.1023/a:1008305507376}
}

RIS

TY  - JOUR
TI  - A Scan-BIST Structure to Test Delay Faults in Sequential Circuits
AU  - P. Girard
AU  - C. Landrault
AU  - V. Moreda
AU  - S. Pravossoudovitch
AU  - A. Virazel
PY  - 1999
JO  - Journal of Electronic Testing
DO  - 10.1023/a:1008305507376
UR  - https://doi.org/10.1023/a:1008305507376
ER  -

APA

Girard, P., Landrault, C., Moreda, V., Pravossoudovitch, S., & Virazel, A. (1999). A Scan-BIST Structure to Test Delay Faults in Sequential Circuits. Journal of Electronic Testing. https://doi.org/10.1023/a:1008305507376

Source records

crossref · retrieved 2026-11-04T00:11:42.310Z