Photon-free (s)CMOS camera characterization for artifact reduction in high- and super-resolution microscopy.
- DOI
- 10.1038/s41467-022-30907-2
- Published
- 2022-06-11
- Container
- Nat Commun
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1038/s41467-022-30907-2,
title = {Photon-free (s)CMOS camera characterization for artifact reduction in high- and super-resolution microscopy.},
author = {Diekmann R and Deschamps J and Li Y and Deguchi T and Tschanz A and Kahnwald M and Matti U and Ries J.},
year = {2022},
journal = {Nat Commun},
doi = {10.1038/s41467-022-30907-2},
url = {https://doi.org/10.1038/s41467-022-30907-2}
}RIS
TY - JOUR TI - Photon-free (s)CMOS camera characterization for artifact reduction in high- and super-resolution microscopy. AU - Diekmann R AU - Deschamps J AU - Li Y AU - Deguchi T AU - Tschanz A AU - Kahnwald M AU - Matti U AU - Ries J. PY - 2022 JO - Nat Commun DO - 10.1038/s41467-022-30907-2 UR - https://doi.org/10.1038/s41467-022-30907-2 ER -
APA
R, D., J, D., Y, L., T, D., A, T., M, K., U, M., & J., R. (2022). Photon-free (s)CMOS camera characterization for artifact reduction in high- and super-resolution microscopy.. Nat Commun. https://doi.org/10.1038/s41467-022-30907-2
Source records
- europe-pmc · retrieved 2026-09-25T18:53:25.073Z