Understanding how junction resistances impact the conduction mechanism in nano-networks

Cian Gabbett, Adam G. Kelly, Emmet Coleman, Luke Doolan, Tian Carey, Kevin Synnatschke, Shixin Liu, Anthony Dawson, Domhnall O’Suilleabhain, Jose Munuera, Eoin Caffrey, John B. Boland, Zdeněk Sofer, Goutam Ghosh, Sachin Kinge, Laurens D. A. Siebbeles, Neelam Yadav, Jagdish K. Vij, Muhammad Awais Aslam, Aleksandar Matkovic, Jonathan N. Coleman

Open source

DOI
10.1038/s41467-024-48614-5
Published
5
Container
Nature Communications
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1038/s41467-024-48614-5,
  title = {Understanding how junction resistances impact the conduction mechanism in nano-networks},
  author = {Cian Gabbett and Adam G. Kelly and Emmet Coleman and Luke Doolan and Tian Carey and Kevin Synnatschke and Shixin Liu and Anthony Dawson and Domhnall O’Suilleabhain and Jose Munuera and Eoin Caffrey and John B. Boland and Zdeněk Sofer and Goutam Ghosh and Sachin Kinge and Laurens D. A. Siebbeles and Neelam Yadav and Jagdish K. Vij and Muhammad Awais Aslam and Aleksandar Matkovic and Jonathan N. Coleman},
  year = {2024},
  journal = {Nature Communications},
  doi = {10.1038/s41467-024-48614-5},
  url = {https://doi.org/10.1038/s41467-024-48614-5}
}

RIS

TY  - JOUR
TI  - Understanding how junction resistances impact the conduction mechanism in nano-networks
AU  - Cian Gabbett
AU  - Adam G. Kelly
AU  - Emmet Coleman
AU  - Luke Doolan
AU  - Tian Carey
AU  - Kevin Synnatschke
AU  - Shixin Liu
AU  - Anthony Dawson
AU  - Domhnall O’Suilleabhain
AU  - Jose Munuera
AU  - Eoin Caffrey
AU  - John B. Boland
AU  - Zdeněk Sofer
AU  - Goutam Ghosh
AU  - Sachin Kinge
AU  - Laurens D. A. Siebbeles
AU  - Neelam Yadav
AU  - Jagdish K. Vij
AU  - Muhammad Awais Aslam
AU  - Aleksandar Matkovic
AU  - Jonathan N. Coleman
PY  - 2024
JO  - Nature Communications
DO  - 10.1038/s41467-024-48614-5
UR  - https://doi.org/10.1038/s41467-024-48614-5
ER  - 

APA

Gabbett, C., Kelly, A. G., Coleman, E., Doolan, L., Carey, T., Synnatschke, K., Liu, S., Dawson, A., O’Suilleabhain, D., Munuera, J., Caffrey, E., Boland, J. B., Sofer, Z., Ghosh, G., Kinge, S., Siebbeles, L. D. A., Yadav, N., Vij, J. K., Aslam, M. A., Matkovic, A., & Coleman, J. N. (2024). Understanding how junction resistances impact the conduction mechanism in nano-networks. Nature Communications. https://doi.org/10.1038/s41467-024-48614-5

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