Breaking high-temperature dielectric energy storage limits through suppression of charge carrier transport

Lei Zhang, Xuan Zhao, Xi Chen, Zhaoxin Ma, Bei Li, Mi Tang, Meng Shen, Xin Zhang, Yongming Hu, Yunbin He, Qingfeng Zhang, Xiaoguang Li

Open source

DOI: 10.1038/s41467-026-74835-x
Published: 2026-06-24
Container: Nature Communications
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1038/s41467-026-74835-x,
  title = {Breaking high-temperature dielectric energy storage limits through suppression of charge carrier transport},
  author = {Lei Zhang and Xuan Zhao and Xi Chen and Zhaoxin Ma and Bei Li and Mi Tang and Meng Shen and Xin Zhang and Yongming Hu and Yunbin He and Qingfeng Zhang and Xiaoguang Li},
  year = {2026},
  journal = {Nature Communications},
  doi = {10.1038/s41467-026-74835-x},
  url = {https://doi.org/10.1038/s41467-026-74835-x}
}

RIS

TY  - JOUR
TI  - Breaking high-temperature dielectric energy storage limits through suppression of charge carrier transport
AU  - Lei Zhang
AU  - Xuan Zhao
AU  - Xi Chen
AU  - Zhaoxin Ma
AU  - Bei Li
AU  - Mi Tang
AU  - Meng Shen
AU  - Xin Zhang
AU  - Yongming Hu
AU  - Yunbin He
AU  - Qingfeng Zhang
AU  - Xiaoguang Li
PY  - 2026
JO  - Nature Communications
DO  - 10.1038/s41467-026-74835-x
UR  - https://doi.org/10.1038/s41467-026-74835-x
ER  -

APA

Zhang, L., Zhao, X., Chen, X., Ma, Z., Li, B., Tang, M., Shen, M., Zhang, X., Hu, Y., He, Y., Zhang, Q., & Li, X. (2026). Breaking high-temperature dielectric energy storage limits through suppression of charge carrier transport. Nature Communications. https://doi.org/10.1038/s41467-026-74835-x

Source records

crossref · retrieved 2026-11-10T16:50:16.090Z