Electrical control of exchange bias in sub-10 nm regime enabled by single-nanotube patterning.

Li H, Zhang K, Zhang Z, Zhou D, Wang S, Yao Y, Du A, Zhu D, Guo Z, Cheng S, Lu S, Jiang K, Zhao W.

Open source

DOI
10.1038/s41467-026-76524-1
Published
2026-08-07
Container
Nat Commun
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1038/s41467-026-76524-1,
  title = {Electrical control of exchange bias in sub-10 nm regime enabled by single-nanotube patterning.},
  author = {Li H and  Zhang K and  Zhang Z and  Zhou D and  Wang S and  Yao Y and  Du A and  Zhu D and  Guo Z and  Cheng S and  Lu S and  Jiang K and  Zhao W.},
  year = {2026},
  journal = {Nat Commun},
  doi = {10.1038/s41467-026-76524-1},
  url = {https://doi.org/10.1038/s41467-026-76524-1}
}

RIS

TY  - JOUR
TI  - Electrical control of exchange bias in sub-10 nm regime enabled by single-nanotube patterning.
AU  - Li H
AU  -  Zhang K
AU  -  Zhang Z
AU  -  Zhou D
AU  -  Wang S
AU  -  Yao Y
AU  -  Du A
AU  -  Zhu D
AU  -  Guo Z
AU  -  Cheng S
AU  -  Lu S
AU  -  Jiang K
AU  -  Zhao W.
PY  - 2026
JO  - Nat Commun
DO  - 10.1038/s41467-026-76524-1
UR  - https://doi.org/10.1038/s41467-026-76524-1
ER  -

APA

H, L., K, Z., Z, Z., D, Z., S, W., Y, Y., A, D., D, Z., Z, G., S, C., S, L., K, J., & W., Z. (2026). Electrical control of exchange bias in sub-10 nm regime enabled by single-nanotube patterning.. Nat Commun. https://doi.org/10.1038/s41467-026-76524-1

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