Stacking faults from a different angle – Overcoming the edge-on limit in high-resolution defect analysis
- DOI
- 10.1038/s41467-026-77584-z
- Published
- 2026-09-11
- Container
- Nature Communications
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1038/s41467-026-77584-z,
title = {Stacking faults from a different angle – Overcoming the edge-on limit in high-resolution defect analysis},
author = {Nicolas Karpstein and Lukas Müller and Andreas Bezold and Michael J. Mills and Steffen Neumeier and Erdmann Spiecker},
year = {2026},
journal = {Nature Communications},
doi = {10.1038/s41467-026-77584-z},
url = {https://doi.org/10.1038/s41467-026-77584-z}
}RIS
TY - JOUR TI - Stacking faults from a different angle – Overcoming the edge-on limit in high-resolution defect analysis AU - Nicolas Karpstein AU - Lukas Müller AU - Andreas Bezold AU - Michael J. Mills AU - Steffen Neumeier AU - Erdmann Spiecker PY - 2026 JO - Nature Communications DO - 10.1038/s41467-026-77584-z UR - https://doi.org/10.1038/s41467-026-77584-z ER -
APA
Karpstein, N., Müller, L., Bezold, A., Mills, M. J., Neumeier, S., & Spiecker, E. (2026). Stacking faults from a different angle – Overcoming the edge-on limit in high-resolution defect analysis. Nature Communications. https://doi.org/10.1038/s41467-026-77584-z
Source records
- crossref · retrieved 2026-09-26T08:40:34.620Z