DeepPatent2: A Large-Scale Benchmarking Corpus for Technical Drawing Understanding.

Ajayi K, Wei X, Gryder M, Shields W, Wu J, Jones SM, Kucer M, Oyen D

DOI: 10.1038/s41597-023-02653-7
Published: 2023 Nov 7
Container: Scientific data
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1038/s41597-023-02653-7,
  title = {DeepPatent2: A Large-Scale Benchmarking Corpus for Technical Drawing Understanding.},
  author = {Ajayi K and Wei X and Gryder M and Shields W and Wu J and Jones SM and Kucer M and Oyen D},
  year = {2023},
  journal = {Scientific data},
  doi = {10.1038/s41597-023-02653-7},
  url = {https://doi.org/10.1038/s41597-023-02653-7}
}

RIS

TY  - JOUR
TI  - DeepPatent2: A Large-Scale Benchmarking Corpus for Technical Drawing Understanding.
AU  - Ajayi K
AU  - Wei X
AU  - Gryder M
AU  - Shields W
AU  - Wu J
AU  - Jones SM
AU  - Kucer M
AU  - Oyen D
PY  - 2023
JO  - Scientific data
DO  - 10.1038/s41597-023-02653-7
UR  - https://doi.org/10.1038/s41597-023-02653-7
ER  -

APA

K, A., X, W., M, G., W, S., J, W., SM, J., M, K., & D, O. (2023). DeepPatent2: A Large-Scale Benchmarking Corpus for Technical Drawing Understanding.. Scientific data. https://doi.org/10.1038/s41597-023-02653-7

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pubmed · retrieved 2026-09-27T10:49:15.465Z