PatentOCR: A Benchmark for Fine-Grained Detection and OCR of Component Identifiers in Patent Drawings.

Wang Y, Qiu Y, Chen Y.

Open source

DOI
10.1038/s41597-026-07829-5
Published
2026-07-07
Container
Sci Data
Publisher
Not recorded
Open access
no

Credibility signals

limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1038/s41597-026-07829-5,
  title = {PatentOCR: A Benchmark for Fine-Grained Detection and OCR of Component Identifiers in Patent Drawings.},
  author = {Wang Y and  Qiu Y and  Chen Y.},
  year = {2026},
  journal = {Sci Data},
  doi = {10.1038/s41597-026-07829-5},
  url = {https://doi.org/10.1038/s41597-026-07829-5}
}

RIS

TY  - JOUR
TI  - PatentOCR: A Benchmark for Fine-Grained Detection and OCR of Component Identifiers in Patent Drawings.
AU  - Wang Y
AU  -  Qiu Y
AU  -  Chen Y.
PY  - 2026
JO  - Sci Data
DO  - 10.1038/s41597-026-07829-5
UR  - https://doi.org/10.1038/s41597-026-07829-5
ER  - 

APA

Y, W., Y, Q., & Y., C. (2026). PatentOCR: A Benchmark for Fine-Grained Detection and OCR of Component Identifiers in Patent Drawings.. Sci Data. https://doi.org/10.1038/s41597-026-07829-5

Source records