Optical diffraction phenomena around the edges of photodetectors: A simplified method for metrological applications.

Santhanakrishnan T, Rajesh R, Awasthi RL, Sreehari CV.

DOI: 10.1038/s41598-019-40270-w
Published: 2019-03-04
Container: Sci Rep
Publisher: Not recorded
Open access: yes

Credibility signals

limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

cautionDOI registered: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
cautionDOI resolves: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
supportingOpen access status: Normalized open-access status: open. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1038/s41598-019-40270-w,
  title = {Optical diffraction phenomena around the edges of photodetectors: A simplified method for metrological applications.},
  author = {Santhanakrishnan T and  Rajesh R and  Awasthi RL and  Sreehari CV.},
  year = {2019},
  journal = {Sci Rep},
  doi = {10.1038/s41598-019-40270-w},
  url = {https://doi.org/10.1038/s41598-019-40270-w}
}

RIS

TY  - JOUR
TI  - Optical diffraction phenomena around the edges of photodetectors: A simplified method for metrological applications.
AU  - Santhanakrishnan T
AU  -  Rajesh R
AU  -  Awasthi RL
AU  -  Sreehari CV.
PY  - 2019
JO  - Sci Rep
DO  - 10.1038/s41598-019-40270-w
UR  - https://doi.org/10.1038/s41598-019-40270-w
ER  -

APA

T, S., R, R., RL, A., & CV., S. (2019). Optical diffraction phenomena around the edges of photodetectors: A simplified method for metrological applications.. Sci Rep. https://doi.org/10.1038/s41598-019-40270-w

Source records

europe-pmc · retrieved 2026-09-26T01:25:52.147Z