Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band
- DOI
- 10.1038/s41598-021-00187-9
- Published
- 2021-10-19
- Container
- Scientific Reports
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1038/s41598-021-00187-9,
title = {Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band},
author = {Thanh-Luan Vu and Stéphane Barlerin and Yves Stricot and Ronan Sauleau and Mauro Ettorre and David González-Ovejero},
year = {2021},
journal = {Scientific Reports},
doi = {10.1038/s41598-021-00187-9},
url = {https://doi.org/10.1038/s41598-021-00187-9}
}RIS
TY - JOUR TI - Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band AU - Thanh-Luan Vu AU - Stéphane Barlerin AU - Yves Stricot AU - Ronan Sauleau AU - Mauro Ettorre AU - David González-Ovejero PY - 2021 JO - Scientific Reports DO - 10.1038/s41598-021-00187-9 UR - https://doi.org/10.1038/s41598-021-00187-9 ER -
APA
Vu, T., Barlerin, S., Stricot, Y., Sauleau, R., Ettorre, M., & González-Ovejero, D. (2021). Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band. Scientific Reports. https://doi.org/10.1038/s41598-021-00187-9
Source records
- crossref · retrieved 2026-09-27T09:56:21.509Z