Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 10(20) cm(-3).

Agulto VC, Iwamoto T, Kitahara H, Toya K, Mag-Usara VK, Imanishi M, Mori Y, Yoshimura M, Nakajima M

Open source

DOI: 10.1038/s41598-021-97253-z
Published: 2021 Sep 15
Container: Scientific reports
Publisher: Not recorded
Open access: yes

Credibility signals

uncertain Score 53/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

cautionDOI registered: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
cautionDOI resolves: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
supportingDirectory of Open Access Journals: A matching record was returned by DOAJ. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
supportingOpen access status: Normalized open-access status: open. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1038/s41598-021-97253-z,
  title = {Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 10(20) cm(-3).},
  author = {Agulto VC and Iwamoto T and Kitahara H and Toya K and Mag-Usara VK and Imanishi M and Mori Y and Yoshimura M and Nakajima M},
  year = {2021},
  journal = {Scientific reports},
  doi = {10.1038/s41598-021-97253-z},
  url = {https://doi.org/10.1038/s41598-021-97253-z}
}

RIS

TY  - JOUR
TI  - Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 10(20) cm(-3).
AU  - Agulto VC
AU  - Iwamoto T
AU  - Kitahara H
AU  - Toya K
AU  - Mag-Usara VK
AU  - Imanishi M
AU  - Mori Y
AU  - Yoshimura M
AU  - Nakajima M
PY  - 2021
JO  - Scientific reports
DO  - 10.1038/s41598-021-97253-z
UR  - https://doi.org/10.1038/s41598-021-97253-z
ER  -

APA

VC, A., T, I., H, K., K, T., VK, M., M, I., Y, M., M, Y., & M, N. (2021). Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 10(20) cm(-3).. Scientific reports. https://doi.org/10.1038/s41598-021-97253-z

Source records

pubmed · retrieved 2026-09-27T11:13:05.405Z
europe-pmc · retrieved 2026-09-27T11:13:05.407Z
doaj · retrieved 2026-09-27T11:13:05.417Z