Strain-induced degradation and recovery of flexible NbO(x)-based threshold switching device.
- DOI
- 10.1038/s41598-023-43192-w
- Published
- 2023 Sep 25
- Container
- Scientific reports
- Publisher
- Not recorded
- Open access
- yes
Credibility signals
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Cite this work
BibTeX
@article{allodium:10.1038/s41598-023-43192-w,
title = {Strain-induced degradation and recovery of flexible NbO(x)-based threshold switching device.},
author = {Ang JM and Dananjaya PA and Ang CCI and Lim GJ and Lew WS},
year = {2023},
journal = {Scientific reports},
doi = {10.1038/s41598-023-43192-w},
url = {https://doi.org/10.1038/s41598-023-43192-w}
}RIS
TY - JOUR TI - Strain-induced degradation and recovery of flexible NbO(x)-based threshold switching device. AU - Ang JM AU - Dananjaya PA AU - Ang CCI AU - Lim GJ AU - Lew WS PY - 2023 JO - Scientific reports DO - 10.1038/s41598-023-43192-w UR - https://doi.org/10.1038/s41598-023-43192-w ER -
APA
JM, A., PA, D., CCI, A., GJ, L., & WS, L. (2023). Strain-induced degradation and recovery of flexible NbO(x)-based threshold switching device.. Scientific reports. https://doi.org/10.1038/s41598-023-43192-w