Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction
- DOI
- 10.1038/s41598-024-56546-9
- Published
- 2024-03-14
- Container
- Scientific Reports
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1038/s41598-024-56546-9,
title = {Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction},
author = {Sangwon Lee and Tracy D. Berman and Can Yildirim and Carsten Detlefs and John E. Allison and Ashley Bucsek},
year = {2024},
journal = {Scientific Reports},
doi = {10.1038/s41598-024-56546-9},
url = {https://doi.org/10.1038/s41598-024-56546-9}
}RIS
TY - JOUR TI - Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction AU - Sangwon Lee AU - Tracy D. Berman AU - Can Yildirim AU - Carsten Detlefs AU - John E. Allison AU - Ashley Bucsek PY - 2024 JO - Scientific Reports DO - 10.1038/s41598-024-56546-9 UR - https://doi.org/10.1038/s41598-024-56546-9 ER -
APA
Lee, S., Berman, T. D., Yildirim, C., Detlefs, C., Allison, J. E., & Bucsek, A. (2024). Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction. Scientific Reports. https://doi.org/10.1038/s41598-024-56546-9
Source records
- crossref · retrieved 2026-11-10T10:33:19.644Z