Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction.
- DOI
- 10.1038/s41598-024-56546-9
- Published
- 2024 Mar 14
- Container
- Scientific reports
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1038/s41598-024-56546-9,
title = {Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction.},
author = {Lee S and Berman TD and Yildirim C and Detlefs C and Allison JE and Bucsek A},
year = {2024},
journal = {Scientific reports},
doi = {10.1038/s41598-024-56546-9},
url = {https://doi.org/10.1038/s41598-024-56546-9}
}RIS
TY - JOUR TI - Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction. AU - Lee S AU - Berman TD AU - Yildirim C AU - Detlefs C AU - Allison JE AU - Bucsek A PY - 2024 JO - Scientific reports DO - 10.1038/s41598-024-56546-9 UR - https://doi.org/10.1038/s41598-024-56546-9 ER -
APA
S, L., TD, B., C, Y., C, D., JE, A., & A, B. (2024). Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction.. Scientific reports. https://doi.org/10.1038/s41598-024-56546-9
Source records
- pubmed · retrieved 2026-09-25T05:47:59.842Z