Highly uniform thermally undercut silicon photonic devices in a 300 mm CMOS foundry process.

Parsons R, Jang K, Wang Y, Novick A, Smith AM, Tison CC, Gebregiorgis Y, Deenadayalan V, Niekerk MV, Carpenter L, Ngai T, Leake G, Coleman D, Meng X, Preble S, Fanto ML, Bergman K, Rizzo A

Open source

DOI
10.1038/s41598-025-14480-4
Published
2025 Aug 14
Container
Scientific reports
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1038/s41598-025-14480-4,
  title = {Highly uniform thermally undercut silicon photonic devices in a 300 mm CMOS foundry process.},
  author = {Parsons R and Jang K and Wang Y and Novick A and Smith AM and Tison CC and Gebregiorgis Y and Deenadayalan V and Niekerk MV and Carpenter L and Ngai T and Leake G and Coleman D and Meng X and Preble S and Fanto ML and Bergman K and Rizzo A},
  year = {2025},
  journal = {Scientific reports},
  doi = {10.1038/s41598-025-14480-4},
  url = {https://doi.org/10.1038/s41598-025-14480-4}
}

RIS

TY  - JOUR
TI  - Highly uniform thermally undercut silicon photonic devices in a 300 mm CMOS foundry process.
AU  - Parsons R
AU  - Jang K
AU  - Wang Y
AU  - Novick A
AU  - Smith AM
AU  - Tison CC
AU  - Gebregiorgis Y
AU  - Deenadayalan V
AU  - Niekerk MV
AU  - Carpenter L
AU  - Ngai T
AU  - Leake G
AU  - Coleman D
AU  - Meng X
AU  - Preble S
AU  - Fanto ML
AU  - Bergman K
AU  - Rizzo A
PY  - 2025
JO  - Scientific reports
DO  - 10.1038/s41598-025-14480-4
UR  - https://doi.org/10.1038/s41598-025-14480-4
ER  - 

APA

R, P., K, J., Y, W., A, N., AM, S., CC, T., Y, G., V, D., MV, N., L, C., T, N., G, L., D, C., X, M., S, P., ML, F., K, B., & A, R. (2025). Highly uniform thermally undercut silicon photonic devices in a 300 mm CMOS foundry process.. Scientific reports. https://doi.org/10.1038/s41598-025-14480-4

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