Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations

Yuta Shuseki, Akihiko Fujiwara, Nobuhiko Mitoma, Takio Kizu, Toshihide Nabatame, Kazuhito Tsukagoshi, Yohei Onodera, Atsunobu Masuno, Koji Ohara, Shinji Kohara

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DOI: 10.1038/s41598-025-20384-0
Published: 2025-10-21
Container: Scientific Reports
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1038/s41598-025-20384-0,
  title = {Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations},
  author = {Yuta Shuseki and Akihiko Fujiwara and Nobuhiko Mitoma and Takio Kizu and Toshihide Nabatame and Kazuhito Tsukagoshi and Yohei Onodera and Atsunobu Masuno and Koji Ohara and Shinji Kohara},
  year = {2025},
  journal = {Scientific Reports},
  doi = {10.1038/s41598-025-20384-0},
  url = {https://doi.org/10.1038/s41598-025-20384-0}
}

RIS

TY  - JOUR
TI  - Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations
AU  - Yuta Shuseki
AU  - Akihiko Fujiwara
AU  - Nobuhiko Mitoma
AU  - Takio Kizu
AU  - Toshihide Nabatame
AU  - Kazuhito Tsukagoshi
AU  - Yohei Onodera
AU  - Atsunobu Masuno
AU  - Koji Ohara
AU  - Shinji Kohara
PY  - 2025
JO  - Scientific Reports
DO  - 10.1038/s41598-025-20384-0
UR  - https://doi.org/10.1038/s41598-025-20384-0
ER  -

APA

Shuseki, Y., Fujiwara, A., Mitoma, N., Kizu, T., Nabatame, T., Tsukagoshi, K., Onodera, Y., Masuno, A., Ohara, K., & Kohara, S. (2025). Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations. Scientific Reports. https://doi.org/10.1038/s41598-025-20384-0

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crossref · retrieved 2026-09-25T15:21:03.304Z