Automated inspection of P&ID object recognition using deep learning

Ji-Beob Kim, Yoochan Moon, Seung-Tae Han, Duhwan Mun

Open source

DOI
10.1038/s41598-025-25506-2
Published
2025-11-07
Container
Scientific Reports
Publisher
Springer Science and Business Media LLC
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1038/s41598-025-25506-2,
  title = {Automated inspection of P\&ID object recognition using deep learning},
  author = {Ji-Beob Kim and Yoochan Moon and Seung-Tae Han and Duhwan Mun},
  year = {2025},
  journal = {Scientific Reports},
  doi = {10.1038/s41598-025-25506-2},
  url = {https://doi.org/10.1038/s41598-025-25506-2}
}

RIS

TY  - JOUR
TI  - Automated inspection of P&ID object recognition using deep learning
AU  - Ji-Beob Kim
AU  - Yoochan Moon
AU  - Seung-Tae Han
AU  - Duhwan Mun
PY  - 2025
JO  - Scientific Reports
DO  - 10.1038/s41598-025-25506-2
UR  - https://doi.org/10.1038/s41598-025-25506-2
ER  - 

APA

Kim, J., Moon, Y., Han, S., & Mun, D. (2025). Automated inspection of P&ID object recognition using deep learning. Scientific Reports. https://doi.org/10.1038/s41598-025-25506-2

Source records