A temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth microbridges for X-ray transition-edge sensor absorbers.
- DOI
- 10.1038/s41598-025-27049-y
- Published
- 2025 Nov 23
- Container
- Scientific reports
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1038/s41598-025-27049-y,
title = {A temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth microbridges for X-ray transition-edge sensor absorbers.},
author = {Quaranta O and Coppola N and Gades L and Galdi A and Guruswamy T and Montella L and Mauro A and Maritato L and Miceli A and Pagano S and Barone C},
year = {2025},
journal = {Scientific reports},
doi = {10.1038/s41598-025-27049-y},
url = {https://doi.org/10.1038/s41598-025-27049-y}
}RIS
TY - JOUR TI - A temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth microbridges for X-ray transition-edge sensor absorbers. AU - Quaranta O AU - Coppola N AU - Gades L AU - Galdi A AU - Guruswamy T AU - Montella L AU - Mauro A AU - Maritato L AU - Miceli A AU - Pagano S AU - Barone C PY - 2025 JO - Scientific reports DO - 10.1038/s41598-025-27049-y UR - https://doi.org/10.1038/s41598-025-27049-y ER -
APA
O, Q., N, C., L, G., A, G., T, G., L, M., A, M., L, M., A, M., S, P., & C, B. (2025). A temperature-induced hysteretic behavior of resistivity and magnetoresistance of electrodeposited bismuth microbridges for X-ray transition-edge sensor absorbers.. Scientific reports. https://doi.org/10.1038/s41598-025-27049-y
Source records
- pubmed · retrieved 2026-09-26T01:48:35.554Z
- europe-pmc · retrieved 2026-09-26T01:48:35.565Z
- doaj · retrieved 2026-09-26T01:48:35.594Z