Mapping defect distribution in transparent single-walled carbon nanotube film with electrical resistance tomography.

Minakawa K, Nakada T, Kaneko R, Ikuno T

DOI: 10.1038/s41598-025-29839-w
Published: 2025 Dec 18
Container: Scientific reports
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1038/s41598-025-29839-w,
  title = {Mapping defect distribution in transparent single-walled carbon nanotube film with electrical resistance tomography.},
  author = {Minakawa K and Nakada T and Kaneko R and Ikuno T},
  year = {2025},
  journal = {Scientific reports},
  doi = {10.1038/s41598-025-29839-w},
  url = {https://doi.org/10.1038/s41598-025-29839-w}
}

RIS

TY  - JOUR
TI  - Mapping defect distribution in transparent single-walled carbon nanotube film with electrical resistance tomography.
AU  - Minakawa K
AU  - Nakada T
AU  - Kaneko R
AU  - Ikuno T
PY  - 2025
JO  - Scientific reports
DO  - 10.1038/s41598-025-29839-w
UR  - https://doi.org/10.1038/s41598-025-29839-w
ER  -

APA

K, M., T, N., R, K., & T, I. (2025). Mapping defect distribution in transparent single-walled carbon nanotube film with electrical resistance tomography.. Scientific reports. https://doi.org/10.1038/s41598-025-29839-w

Source records

pubmed · retrieved 2026-09-26T21:23:24.227Z