Optimizing precision in quantum metrology through engineered environments

K. Berrada

Open source

DOI: 10.1038/s41598-025-31810-8
Published: 2026-03-30
Container: Scientific Reports
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1038/s41598-025-31810-8,
  title = {Optimizing precision in quantum metrology through engineered environments},
  author = {K. Berrada},
  year = {2026},
  journal = {Scientific Reports},
  doi = {10.1038/s41598-025-31810-8},
  url = {https://doi.org/10.1038/s41598-025-31810-8}
}

RIS

TY  - JOUR
TI  - Optimizing precision in quantum metrology through engineered environments
AU  - K. Berrada
PY  - 2026
JO  - Scientific Reports
DO  - 10.1038/s41598-025-31810-8
UR  - https://doi.org/10.1038/s41598-025-31810-8
ER  -

APA

Berrada, K. (2026). Optimizing precision in quantum metrology through engineered environments. Scientific Reports. https://doi.org/10.1038/s41598-025-31810-8

Source records

crossref · retrieved 2026-11-10T14:14:15.420Z