Multiscale diffusion-enhanced attention network for steel surface defect detection in Polysilicon Production.

Duan Y, He L, Wang Z, Sa J, Yang J, Chen X, Shi B, Zhang Y, Sun J

Open source

DOI
10.1038/s41598-026-35913-8
Published
2026 Jan 16
Container
Scientific reports
Publisher
Not recorded
Open access
yes

Credibility signals

limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1038/s41598-026-35913-8,
  title = {Multiscale diffusion-enhanced attention network for steel surface defect detection in Polysilicon Production.},
  author = {Duan Y and He L and Wang Z and Sa J and Yang J and Chen X and Shi B and Zhang Y and Sun J},
  year = {2026},
  journal = {Scientific reports},
  doi = {10.1038/s41598-026-35913-8},
  url = {https://doi.org/10.1038/s41598-026-35913-8}
}

RIS

TY  - JOUR
TI  - Multiscale diffusion-enhanced attention network for steel surface defect detection in Polysilicon Production.
AU  - Duan Y
AU  - He L
AU  - Wang Z
AU  - Sa J
AU  - Yang J
AU  - Chen X
AU  - Shi B
AU  - Zhang Y
AU  - Sun J
PY  - 2026
JO  - Scientific reports
DO  - 10.1038/s41598-026-35913-8
UR  - https://doi.org/10.1038/s41598-026-35913-8
ER  - 

APA

Y, D., L, H., Z, W., J, S., J, Y., X, C., B, S., Y, Z., & J, S. (2026). Multiscale diffusion-enhanced attention network for steel surface defect detection in Polysilicon Production.. Scientific reports. https://doi.org/10.1038/s41598-026-35913-8

Source records