Super-resolution approach tailored for wafer transmission electron microscopy images.

Kim S, Baek I, Cho H, Jo Y, Roh H, Kim K, Jo M, Tae J, Kim SB

DOI: 10.1038/s41598-026-45776-8
Published: 2026 Mar 30
Container: Scientific reports
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1038/s41598-026-45776-8,
  title = {Super-resolution approach tailored for wafer transmission electron microscopy images.},
  author = {Kim S and Baek I and Cho H and Jo Y and Roh H and Kim K and Jo M and Tae J and Kim SB},
  year = {2026},
  journal = {Scientific reports},
  doi = {10.1038/s41598-026-45776-8},
  url = {https://doi.org/10.1038/s41598-026-45776-8}
}

RIS

TY  - JOUR
TI  - Super-resolution approach tailored for wafer transmission electron microscopy images.
AU  - Kim S
AU  - Baek I
AU  - Cho H
AU  - Jo Y
AU  - Roh H
AU  - Kim K
AU  - Jo M
AU  - Tae J
AU  - Kim SB
PY  - 2026
JO  - Scientific reports
DO  - 10.1038/s41598-026-45776-8
UR  - https://doi.org/10.1038/s41598-026-45776-8
ER  -

APA

S, K., I, B., H, C., Y, J., H, R., K, K., M, J., J, T., & SB, K. (2026). Super-resolution approach tailored for wafer transmission electron microscopy images.. Scientific reports. https://doi.org/10.1038/s41598-026-45776-8

Source records

pubmed · retrieved 2026-09-27T01:26:56.697Z