Predictive modeling of drain current in advanced FET architectures using ML-based TCAD calibration
- DOI
- 10.1038/s41598-026-48859-8
- Published
- 2026-05-05
- Container
- Scientific Reports
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1038/s41598-026-48859-8,
title = {Predictive modeling of drain current in advanced FET architectures using ML-based TCAD calibration},
author = {Siddhabrata Mohapatra and Roshni Shekhar and Aditya Jadhav and Biswajit Jena},
year = {2026},
journal = {Scientific Reports},
doi = {10.1038/s41598-026-48859-8},
url = {https://doi.org/10.1038/s41598-026-48859-8}
}RIS
TY - JOUR TI - Predictive modeling of drain current in advanced FET architectures using ML-based TCAD calibration AU - Siddhabrata Mohapatra AU - Roshni Shekhar AU - Aditya Jadhav AU - Biswajit Jena PY - 2026 JO - Scientific Reports DO - 10.1038/s41598-026-48859-8 UR - https://doi.org/10.1038/s41598-026-48859-8 ER -
APA
Mohapatra, S., Shekhar, R., Jadhav, A., & Jena, B. (2026). Predictive modeling of drain current in advanced FET architectures using ML-based TCAD calibration. Scientific Reports. https://doi.org/10.1038/s41598-026-48859-8
Source records
- crossref · retrieved 2026-11-10T00:46:31.073Z