Investigating the impact of irradiation on various ringFET-based SRAM circuits using 3D TCAD

R. Anandhi, K. K. Nagarajan, M. Ramya

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DOI: 10.1038/s41598-026-55093-9
Published: 2026-06-15
Container: Scientific Reports
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1038/s41598-026-55093-9,
  title = {Investigating the impact of irradiation on various ringFET-based SRAM circuits using 3D TCAD},
  author = {R. Anandhi and K. K. Nagarajan and M. Ramya},
  year = {2026},
  journal = {Scientific Reports},
  doi = {10.1038/s41598-026-55093-9},
  url = {https://doi.org/10.1038/s41598-026-55093-9}
}

RIS

TY  - JOUR
TI  - Investigating the impact of irradiation on various ringFET-based SRAM circuits using 3D TCAD
AU  - R. Anandhi
AU  - K. K. Nagarajan
AU  - M. Ramya
PY  - 2026
JO  - Scientific Reports
DO  - 10.1038/s41598-026-55093-9
UR  - https://doi.org/10.1038/s41598-026-55093-9
ER  -

APA

Anandhi, R., Nagarajan, K. K., & Ramya, M. (2026). Investigating the impact of irradiation on various ringFET-based SRAM circuits using 3D TCAD. Scientific Reports. https://doi.org/10.1038/s41598-026-55093-9

Source records

crossref · retrieved 2026-11-10T12:52:57.723Z