Unsupervised feature learning and optimised clustering with fine-tuning for automatic semiconductor wafer defect recognition
- DOI
- 10.1038/s41598-026-63373-7
- Published
- 2026-07-23
- Container
- Scientific Reports
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1038/s41598-026-63373-7,
title = {Unsupervised feature learning and optimised clustering with fine-tuning for automatic semiconductor wafer defect recognition},
author = {M. M. Manjurul Islam and Girijesh Prasad},
year = {2026},
journal = {Scientific Reports},
doi = {10.1038/s41598-026-63373-7},
url = {https://doi.org/10.1038/s41598-026-63373-7}
}RIS
TY - JOUR TI - Unsupervised feature learning and optimised clustering with fine-tuning for automatic semiconductor wafer defect recognition AU - M. M. Manjurul Islam AU - Girijesh Prasad PY - 2026 JO - Scientific Reports DO - 10.1038/s41598-026-63373-7 UR - https://doi.org/10.1038/s41598-026-63373-7 ER -
APA
Islam, M. M. M., & Prasad, G. (2026). Unsupervised feature learning and optimised clustering with fine-tuning for automatic semiconductor wafer defect recognition. Scientific Reports. https://doi.org/10.1038/s41598-026-63373-7
Source records
- crossref · retrieved 2026-11-10T13:32:51.546Z