Direct Observation of the Biaxial Stress Effect on Efficiency Droop in GaN-based Light-emitting Diode under Electrical Injection
- DOI
- 10.1038/srep17227
- Published
- 2015-12-04
- Container
- Scientific Reports
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1038/srep17227,
title = {Direct Observation of the Biaxial Stress Effect on Efficiency Droop in GaN-based Light-emitting Diode under Electrical Injection},
author = {Jinjian Zheng and Shuiqing Li and Chilun Chou and Wei Lin and Feilin Xun and Fei Guo and Tongchang Zheng and Shuping Li and Junyong Kang},
year = {2015},
journal = {Scientific Reports},
doi = {10.1038/srep17227},
url = {https://doi.org/10.1038/srep17227}
}RIS
TY - JOUR TI - Direct Observation of the Biaxial Stress Effect on Efficiency Droop in GaN-based Light-emitting Diode under Electrical Injection AU - Jinjian Zheng AU - Shuiqing Li AU - Chilun Chou AU - Wei Lin AU - Feilin Xun AU - Fei Guo AU - Tongchang Zheng AU - Shuping Li AU - Junyong Kang PY - 2015 JO - Scientific Reports DO - 10.1038/srep17227 UR - https://doi.org/10.1038/srep17227 ER -
APA
Zheng, J., Li, S., Chou, C., Lin, W., Xun, F., Guo, F., Zheng, T., Li, S., & Kang, J. (2015). Direct Observation of the Biaxial Stress Effect on Efficiency Droop in GaN-based Light-emitting Diode under Electrical Injection. Scientific Reports. https://doi.org/10.1038/srep17227
Source records
- crossref · retrieved 2026-09-26T18:33:30.805Z