Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

Pavel Linkov, Mikhail Artemyev, Anton E. Efimov, Igor Nabiev

Open source

DOI: 10.1039/c3nr02372a
Published: 2013
Container: Nanoscale
Publisher: Royal Society of Chemistry (RSC)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1039/c3nr02372a,
  title = {Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials},
  author = {Pavel Linkov and Mikhail Artemyev and Anton E. Efimov and Igor Nabiev},
  year = {2013},
  journal = {Nanoscale},
  doi = {10.1039/c3nr02372a},
  url = {https://doi.org/10.1039/c3nr02372a}
}

RIS

TY  - JOUR
TI  - Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials
AU  - Pavel Linkov
AU  - Mikhail Artemyev
AU  - Anton E. Efimov
AU  - Igor Nabiev
PY  - 2013
JO  - Nanoscale
DO  - 10.1039/c3nr02372a
UR  - https://doi.org/10.1039/c3nr02372a
ER  -

APA

Linkov, P., Artemyev, M., Efimov, A. E., & Nabiev, I. (2013). Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials. Nanoscale. https://doi.org/10.1039/c3nr02372a

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crossref · retrieved 2026-09-25T11:39:29.523Z