Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors
- DOI
- 10.1039/d1na00824b
- Published
- 2022
- Container
- Nanoscale Advances
- Publisher
- Royal Society of Chemistry (RSC)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1039/d1na00824b,
title = {Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors},
author = {Mélanie Brouillard and Nicolas Bercu and Ute Zschieschang and Olivier Simonetti and Rakesh Mittapalli and Hagen Klauk and Louis Giraudet},
year = {2022},
journal = {Nanoscale Advances},
doi = {10.1039/d1na00824b},
url = {https://doi.org/10.1039/d1na00824b}
}RIS
TY - JOUR TI - Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors AU - Mélanie Brouillard AU - Nicolas Bercu AU - Ute Zschieschang AU - Olivier Simonetti AU - Rakesh Mittapalli AU - Hagen Klauk AU - Louis Giraudet PY - 2022 JO - Nanoscale Advances DO - 10.1039/d1na00824b UR - https://doi.org/10.1039/d1na00824b ER -
APA
Brouillard, M., Bercu, N., Zschieschang, U., Simonetti, O., Mittapalli, R., Klauk, H., & Giraudet, L. (2022). Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors. Nanoscale Advances. https://doi.org/10.1039/d1na00824b
Source records
- crossref · retrieved 2026-11-10T14:38:59.374Z