Atomic force microscopy as a multimetrological platform for energy devices

Hüsnü Aslan, Khaled Kaja, José Morán-Meza, François Piquemal, José Alvarez, Nicolas Chauvin, José Penuelas, Steffan Møller Sønderskov, Philippe Regreny

Open source

DOI: 10.1039/d4nr05107f
Published: 2025
Container: Nanoscale
Publisher: Royal Society of Chemistry (RSC)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1039/d4nr05107f,
  title = {Atomic force microscopy as a multimetrological platform for energy devices},
  author = {Hüsnü Aslan and Khaled Kaja and José Morán-Meza and François Piquemal and José Alvarez and Nicolas Chauvin and José Penuelas and Steffan Møller Sønderskov and Philippe Regreny},
  year = {2025},
  journal = {Nanoscale},
  doi = {10.1039/d4nr05107f},
  url = {https://doi.org/10.1039/d4nr05107f}
}

RIS

TY  - JOUR
TI  - Atomic force microscopy as a multimetrological platform for energy devices
AU  - Hüsnü Aslan
AU  - Khaled Kaja
AU  - José Morán-Meza
AU  - François Piquemal
AU  - José Alvarez
AU  - Nicolas Chauvin
AU  - José Penuelas
AU  - Steffan Møller Sønderskov
AU  - Philippe Regreny
PY  - 2025
JO  - Nanoscale
DO  - 10.1039/d4nr05107f
UR  - https://doi.org/10.1039/d4nr05107f
ER  -

APA

Aslan, H., Kaja, K., Morán-Meza, J., Piquemal, F., Alvarez, J., Chauvin, N., Penuelas, J., Sønderskov, S. M., & Regreny, P. (2025). Atomic force microscopy as a multimetrological platform for energy devices. Nanoscale. https://doi.org/10.1039/d4nr05107f

Source records

crossref · retrieved 2026-09-26T16:20:44.734Z