Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods
- DOI
- 10.1039/d5cp03107a
- Published
- 2026
- Container
- Physical Chemistry Chemical Physics
- Publisher
- Royal Society of Chemistry (RSC)
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1039/d5cp03107a,
title = {Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods},
author = {Mohammad Rostami and Mehdi Janbazi and Ali Biganeh and Farnaz Ghavami},
year = {2026},
journal = {Physical Chemistry Chemical Physics},
doi = {10.1039/d5cp03107a},
url = {https://doi.org/10.1039/d5cp03107a}
}RIS
TY - JOUR TI - Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods AU - Mohammad Rostami AU - Mehdi Janbazi AU - Ali Biganeh AU - Farnaz Ghavami PY - 2026 JO - Physical Chemistry Chemical Physics DO - 10.1039/d5cp03107a UR - https://doi.org/10.1039/d5cp03107a ER -
APA
Rostami, M., Janbazi, M., Biganeh, A., & Ghavami, F. (2026). Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods. Physical Chemistry Chemical Physics. https://doi.org/10.1039/d5cp03107a
Source records
- crossref · retrieved 2026-11-10T09:27:03.197Z