Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods.
- DOI
- 10.1039/d5cp03107a
- Published
- 2026 Jan 7
- Container
- Physical chemistry chemical physics : PCCP
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1039/d5cp03107a,
title = {Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods.},
author = {Rostami M and Janbazi M and Biganeh A and Ghavami F},
year = {2026},
journal = {Physical chemistry chemical physics : PCCP},
doi = {10.1039/d5cp03107a},
url = {https://doi.org/10.1039/d5cp03107a}
}RIS
TY - JOUR TI - Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods. AU - Rostami M AU - Janbazi M AU - Biganeh A AU - Ghavami F PY - 2026 JO - Physical chemistry chemical physics : PCCP DO - 10.1039/d5cp03107a UR - https://doi.org/10.1039/d5cp03107a ER -
APA
M, R., M, J., A, B., & F, G. (2026). Identification of defects in pure and Al/Ga-doped ZnO to improve X-ray detector performance: experimental and simulation methods.. Physical chemistry chemical physics : PCCP. https://doi.org/10.1039/d5cp03107a
Source records
- pubmed · retrieved 2026-09-25T07:00:02.010Z