Microtron electron beam enables post-synthetic defect engineering in ultrasmall ceria nanocrystals.

Šiška Z, Sojková T, Sojka M, Roupcová P, Mihálik M, Bukvišová K, Krishnan D, Šimoníková L, Gröger R, Pizúrová N

DOI: 10.1039/d6na00191b
Published: 2026 Jul 2
Container: Nanoscale advances
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1039/d6na00191b,
  title = {Microtron electron beam enables post-synthetic defect engineering in ultrasmall ceria nanocrystals.},
  author = {Šiška Z and Sojková T and Sojka M and Roupcová P and Mihálik M and Bukvišová K and Krishnan D and Šimoníková L and Gröger R and Pizúrová N},
  year = {2026},
  journal = {Nanoscale advances},
  doi = {10.1039/d6na00191b},
  url = {https://doi.org/10.1039/d6na00191b}
}

RIS

TY  - JOUR
TI  - Microtron electron beam enables post-synthetic defect engineering in ultrasmall ceria nanocrystals.
AU  - Šiška Z
AU  - Sojková T
AU  - Sojka M
AU  - Roupcová P
AU  - Mihálik M
AU  - Bukvišová K
AU  - Krishnan D
AU  - Šimoníková L
AU  - Gröger R
AU  - Pizúrová N
PY  - 2026
JO  - Nanoscale advances
DO  - 10.1039/d6na00191b
UR  - https://doi.org/10.1039/d6na00191b
ER  -

APA

Z, Š., T, S., M, S., P, R., M, M., K, B., D, K., L, Š., R, G., & N, P. (2026). Microtron electron beam enables post-synthetic defect engineering in ultrasmall ceria nanocrystals.. Nanoscale advances. https://doi.org/10.1039/d6na00191b

Source records

pubmed · retrieved 2026-09-25T04:27:02.669Z