Chirality-sensitive defect localization in helical nanoparticle assemblies <i>via</i> generalized Mie scattering polarimetry

Mengyao Jing, Xingcai Li, Juan Wang, Yunyun Wen, Mingjie Jiang

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DOI: 10.1039/d6nr01369d
Published: 2026
Container: Nanoscale
Publisher: Royal Society of Chemistry (RSC)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1039/d6nr01369d,
  title = {Chirality-sensitive defect localization in helical nanoparticle assemblies
                    <i>via</i>
                    generalized Mie scattering polarimetry},
  author = {Mengyao Jing and Xingcai Li and Juan Wang and Yunyun Wen and Mingjie Jiang},
  year = {2026},
  journal = {Nanoscale},
  doi = {10.1039/d6nr01369d},
  url = {https://doi.org/10.1039/d6nr01369d}
}

RIS

TY  - JOUR
TI  - Chirality-sensitive defect localization in helical nanoparticle assemblies
                    <i>via</i>
                    generalized Mie scattering polarimetry
AU  - Mengyao Jing
AU  - Xingcai Li
AU  - Juan Wang
AU  - Yunyun Wen
AU  - Mingjie Jiang
PY  - 2026
JO  - Nanoscale
DO  - 10.1039/d6nr01369d
UR  - https://doi.org/10.1039/d6nr01369d
ER  -

APA

Jing, M., Li, X., Wang, J., Wen, Y., & Jiang, M. (2026). Chirality-sensitive defect localization in helical nanoparticle assemblies <i>via</i> generalized Mie scattering polarimetry. Nanoscale. https://doi.org/10.1039/d6nr01369d

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crossref · retrieved 2026-09-25T13:40:59.935Z